One technique used to characterize the physical and electronic properties of the surface of a material is Helium Scattering and mass spectrometry. A beam of atoms, usually Helium, is aimed at a surface, and atoms from the surface are ejected. Mass Filters are used to measure the atoms that are scattered, and to pinpoint the angle and time at which the scattering atoms are being released (time of flight analysis). Since the events of this non-destructive surface science method happen quickly, this application requires the use of mass filters that provide high stability and fast response times. Extrels Quadrupole Mass Filters and RF/DC Power Supplies are the ideal choice for Scattering applications.